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a constant frequency is applied to the AFM cantilever while the AFM tip is in contact with the sample, while amplitude variation and phase lag during the scan are measured. Force modulation provides the user with simultaneous surface topography measurements, material elasticity or sti ness (the amplitude of the modulated signal), and energy dissipation characteristics of the sample (from the phase of the cantilever response). When an AFM cantilever is modulated with the driving signal, elastic materials will result in relatively larger modulated amplitude compared to sti er materials because the AFM tip can indent an elastic material. Force modulation has proven its utility in life science studies, polymer studies, experiments on semiconductor materials, and the material sciences, including investigations on composite materials. Force modulation is compatible with measurements in air or liquid, under controlled environments, measurements with temperature control, MAC mode, and electrochemistry. Figure F.8 depicts an example of ATM usage. F.2.6 Phase Imaging

7. I created a 60-pixel version of my brush shape and reduced its Hardness value to 0 percent. I then painted a single white spot at the bottom of each of the new paths. I painted a black spot at the bottom of the original path. 8. I selected the smudge tool, set the Pressure value to 98 percent, and selected a brush with a radius of 16 pixels. At this setting, the tool has a tremendous range, but it eventually fades out. 9. I pressed Enter on the numeric keypad to apply the smudge tool to all three paths at once. The finished image appears in Figure 8-37.

Figure 5-25

(4.6)

Sheppard C J R and M Gu, Aberration Compensation in Confocal Microscopy, Appl Opt, 30, 3563 3567 (1991) Sheppard C J R and M Gu, Axial Imaging Through an Aberrating Layer of Water in Confocal Microscopy, Opt Com, 88, 180 190 (1992) Sheppard C J R and DK Hamilton, Edge Enhancement by Defocusing of Confocal Images, Opt Acta, 31, 723 727 (1984) Sheppard C J R and KG Larkin, Effect of Numerical Aperture on Interference Fringe Spacing, Appl Opt, 34, 4731 4734 (1995) Sheppard C J R and M Roy, Low Coherence Interference Microscopy in P Torok and F J Kao, Eds, Optical Imaging Microscopy, Springer, Berlin, 2003, pp 257 273 Shiono T and K Setsune, Wavelength-Independent Integrated Focus Sensor Using a Re ection Twin Micro-Fresnel Lens, Appl Opt, 28, 5115 5121 (1989) Smith L M and C C.

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Dobson, Absolute Displacement Measurement Using Modulatin of Spectrum of White Light in a Michelson Interfereometer, Appl Opt 28, 3339 3342, (1989) Smith P J, C M Taylor, A J Shaw, and E M McCabe, Programmable Array Microscopy with a Ferroelectric Liquid-Crystal Spatial Light Modulator, Appl Opt, 39, 2664 2669 (2000) Sommargren G E, Optical Heterodyne Pro lometry, Appl Opt, 20, 610 616 (1981) Stout K J and L Blunt (Eds), Three-Dimensional Surface Topography: Measurement, Interpretation and Application, Penton Press, London, 1994 Su C, L Huang, and P Nielson, In-Situ Measurement of in-Plane and out-of-Plane Force Gradient with a Torsional Resonance Mode, AFM, AIP Proc 696, 357 364 (2003) Takeda M, D S Mehta, M Pawlowski, and T Kurokawa, Recent Developments in Spectral Interference Microscopes, Proc SPIE, 5776, 22 28 (2005) Takeda M and H.

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Some information applies to the drawing as a whole or even to your computer system as a whole, rather than to individual objects. This information can be important when there is a problem or when you simply need to find the status of system variables.

Yamamoto, Fourier-Transform Speckle Pro lometry: Three-Dimensional Shape Measurements of Diffuse Objects with Large Height Steps and/or Spatially Isolated Surfaces, Appl Opt, 33, 7829 7837 (1994) Tanaami T, S Otsuki, N Tomosada, Y Kosugi, M Shimizu, and H Ishido, High-Speed 1-Frame/ms Scanning Confocal Microscope with a Microlens and Nipkow Disks, Appl Opt, 41, 4704 4708 (2002) Thomas T T, Rough Surfaces, Imperial College Press, London, 1999 Tiziani H J, Spectral and Temporal Phase Evaluation for Interferometry and Speckle Applications, in: P Rastogi and D Inaudi (Eds), Trends in Optical Nondestructive Testing and Inspection, Elsevier, New York 2000, pp 323 343 Tiziani H J, B Franze, and P Haible, Wavelength-Shift Speckle Interferometry for Absolute Pro lometry Using Mode-Hope Free External Cavity Diode Laser, J Mod Opt, 44, 1485 1496 (1997) Tiziani H J and H M.