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100%(54Mbps) 80 % 48 Mbps 60 % 36 Mbps 40 % 18 Mbps 20 %

3 Sampling Modes and Image Display Three different sampling modes are available on most ultrasound units: the survey mode, in which the data stored in memory is continually updated and displayed, the static mode, in which only maximum US echo signals (values) during a scanning.

model and then locally stored plane wave data are read by each compute node, each compute node computes vertical delay traveltimes to be used in imaging. Once all compute nodes have computed their plane wave components contributions to the image, the global sum is performed to combine individual contributions into nal image.

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9) numerically Second, during each time step of the temporal integration, a linear system that arises from the nite element discretization requires a computational effort of order O(N ), where 1 (The optimal case of = 1 is obtained only when an optimal linear solver, such as multigrid [6], is used) Consequently, a large value of N, for example, of order O(106 ), will give rise to a huge amount of computation in SSLE We recall that the computational work also grows with respect to the number of measurement locations nh , the number of measurement time levels nt , and the number of pumping tests nq All these factors call for the application of parallel computers to SSLE Parallelism arises from the following observations: 1 As mentioned in Section 324, the adjoint-state equation (3.

Figure 11-25: The In & Out Links palette reveals that of the four links on the selected page, one is incomplete.

Device Motherboard Floppy drive Keyboard and mouse CPU cooler fan CPU Video card Memory (per module) Hard drive (per drive) Optical drive (per drive) PCI expansion card (per card) Each USB device (only if it draws power from the system) Each FireWire device (only if it draws power from the system) Case fans (per fan) Power Consumption (Watts) 25 5 3 3 90 120 50 120 10 25 25 7 5 8 3

Figure 7.2 The relative spectral power distributions of CIE Illuminants D50 and F8 (each normalized to 100.0 at 560 nm)

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[9] M. Moeneclaey, M. Van Blade1 and H. Sari, Sensitivity of multiple- access techniques to narrow-band interference, IEEE Trans. on Commun., March, 2001. 135

9) needs to be solved for each pair of measurement location xj and measurement time level tl These different solutions of (39) are totally independent of each other This observation immediately calls for a task parallel approach to the parallelization, because a processor can be assigned to a number of solutions of (39) Note that the cost of each solution of (39) depends on the value of tl , as (39) needs to be solved backward in time from t = tl to t = 0 This will clearly cause some nontriviality with respect to load balancing, but the real inconvenience is the fact that such a task parallel approach implies that every processor computes over the entire domain .

17.1. INTRODUCTION Geometrical measurements of a lens in the optical workshop are necessary to obtain precise lens and optical system parameters. On doing so, one is not only looking for precision but also for speed and simplicity. These measurements should be made following international units and in some cases, must be certi ed by a laboratory from a secondary standard. A review of this topic may be found in the article by Geiser (1965). Geometrical measurements in optical testing may be classi ed mainly in angle, distance, curvature, and focal length measurements. In the production run, it is preferred not to make measurements but comparisons or null measurements. This calls for gauges and templates that are more appropriate for the shop rather than expensive and precise equipment.